Electromigration Inside Logic Cells - Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS - Sachin S. Sapatnekar - Paperback Bog -
Brand: Springer International Publishing AG
Description
This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power.
