Characterization of High Tc Materials and Devices by Electron Microscopy - - Paperback Bog - Cambridge University Press - 2006 - Engelsk - Booktok.dk
Brand: Cambridge University Press
Description
This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications.
